Tino Hofmann
Cited by
Cited by
Ellipsometry at the Nanoscale
M Losurdo, K Hingerl
Springer, 2013
Anisotropy, phonon modes, and free charge carrier parameters in monoclinic -gallium oxide single crystals
M Schubert, R Korlacki, S Knight, T Hofmann, S Schöche, V Darakchieva, ...
Physical Review B 93 (12), 125209, 2016
Ellipsometry of functional organic surfaces and films
K Hinrichs, KJ Eichhorn
Springer, 2018
Protein adsorption on and swelling of polyelectrolyte brushes: A simultaneous ellipsometry-quartz crystal microbalance study
E Bittrich, KB Rodenhausen, KJ Eichhorn, T Hofmann, M Schubert, ...
Biointerphases 5, 159, 2010
Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: determination of free-carrier effective-mass, mobility, and concentration parameters in …
M Schubert, T Hofmann, CM Herzinger
JOSA A 20 (2), 347-356, 2003
Transient Absorption Measurements on Anisotropic Monolayer ReS2
Q Cui, J He, MZ Bellus, M Mirzokarimov, T Hofmann, HY Chiu, M Antonik, ...
Small 11 (41), 5565-5571, 2015
Variable-wavelength frequency-domain terahertz ellipsometry
T Hofmann, CM Herzinger, A Boosalis, TE Tiwald, JA Woollam, ...
Review of Scientific Instruments 81, 023101, 2010
Optical, structural, and magnetic properties of cobalt nanostructure thin films
D Schmidt, AC Kjerstad, T Hofmann, R Skomski, E Schubert, M Schubert
Journal of Applied Physics 105 (11), 113508-113508-7, 2009
Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry
D Schmidt, B Booso, T Hofmann, E Schubert, A Sarangan, M Schubert
Applied Physics Letters 94, 011914, 2009
Generalized ellipsometry for monoclinic absorbing materials: determination of optical constants of Cr columnar thin films
D Schmidt, B Booso, T Hofmann, E Schubert, A Sarangan, M Schubert
Optics letters 34 (7), 992-994, 2009
Terahertz magneto-optic generalized ellipsometry using synchrotron and blackbody radiation
T Hofmann, U Schade, CM Herzinger, P Esquinazi, M Schubert
Review of scientific instruments 77, 063902, 2006
Polaron and phonon properties in proton intercalated amorphous tungsten oxide thin films
MF Saenger, T Höing, BW Robertson, RB Billa, T Hofmann, E Schubert, ...
Physical Review B 78 (24), 245205, 2008
Invited Article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument
P Kühne, CM Herzinger, M Schubert, JA Woollam, T Hofmann
Review of Scientific Instruments 85 (7), 071301, 2014
Resistive hysteresis and interface charge coupling in BaTiO-ZnO heterostructures
VM Voora, T Hofmann, M Brandt, M Lorenz, M Grundmann, N Ashkenov, ...
Applied Physics Letters 94, 142904, 2009
Terahertz ellipsometry and terahertz optical-Hall effect
T Hofmann, CM Herzinger, JL Tedesco, DK Gaskill, JA Woollam, ...
Thin Solid Films 519 (9), 2593-2600, 2011
Anisotropy of the Γ‐point effective mass and mobility in hexagonal InN
T Hofmann, T Chavdarov, V Darakchieva, H Lu, WJ Schaff, M Schubert
physica status solidi (c) 3 (6), 1854-1857, 2006
Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures
T Hofmann, P Kühne, S Schöche, JT Chen, U Forsberg, E Janzén, ...
Applied Physics Letters 101 (19), 192102, 2012
Free electron behavior in InN: On the role of dislocations and surface electron accumulation
V Darakchieva, T Hofmann, M Schubert, BE Sernelius, B Monemar, ...
Applied Physics Letters 94, 022109, 2009
Infrared dielectric response of nanoscribe IP-dip and IP-L monomers after polymerization from 250 cm−1 to 6000 cm−1
DB Fullager, GD Boreman, T Hofmann
Optical Materials Express 7 (3), 888-894, 2017
Optical Hall effect—model description: tutorial
M Schubert, P Kühne, V Darakchieva, T Hofmann
JOSA A 33 (8), 1553-1568, 2016
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