| Determining electrical and dielectric parameters of dependence as function of frequencies in Al/ZnS-PVA/p-Si (MPS) structures N Baraz, İ Yücedağ, Y Azizian-Kalandaragh, Ş Altındal Journal of Materials Science: Materials in Electronics 28, 1315-1321, 2017 | 48 | 2017 |
| Electric and dielectric properties of Au/ZnS-PVA/n-Si (MPS) structures in the frequency range of 10–200 kHz N Baraz, İ Yücedağ, Y Azizian-Kalandaragh, G Ersöz, I Orak, Ş Altındal, ... Journal of Electronic Materials 46, 4276-4286, 2017 | 40 | 2017 |
| Hydrogenic impurity states in zinc-blende In x Ga 1− x N/GaN in cylindrical quantum well wires under hydrostatic pressure NB P Baser, S Elagoz Physica E: Low-Dimensional Systems and Nanostructures Cilt 44 44 (2), 356-360, 2011 | 29* | 2011 |
| Determining electrical and dielectric parameters of Al/ZnS-PVA/p-Si (MPS) structures in wide range of temperature and voltage N Baraz, İ Yücedağ, Y Azizian-Kalandaragh, Ş Altındal Journal of Materials Science: Materials in Electronics 29, 12735-12743, 2018 | 14 | 2018 |
| Controlling the electrical characteristics of Au/n‐Si structure with and without (biphenyl‐CoPc) and (OHSubs‐ZnPc) interfacial layers at room temperature N Baraz, İ Yücedağ, A Demir, G Ersöz, Ş Altındal, M Kandaz Polymers for Advanced Technologies 28 (8), 952-957, 2017 | 6 | 2017 |
| Azizian-Kalandaragh, S Altındal N Baraz, Y IYücedag J. Mater. Sci 28, 1315, 2017 | 6 | 2017 |
| A comparative study on the main electrical parameters of Au/n-Si, Au/biphenyl-CuPc/n-Si/and Au/biphenylsubs-CoPc/n-Si/type Schottky barrier diodes A Demir, İG Yücedağ, G Ersöz, Ş Altındal, N Baraz, M Kandaz Journal of Nanoelectronics and Optoelectronics 11 (5), 620-625, 2016 | 4 | 2016 |
| GaN/InxGa1-xN silindirik kuantum telinde verici safsızlık enerji düzeyleri N Baraz Fen Bilimleri Enstitüsü, 2012 | 2 | 2012 |
| DOKTORA TEZİ ELEKTRİK-ELEKTRONİK VE BİLGİSAYAR MÜHENDİSLİĞİ ANABİLİM DALI E BİR, N BARAZ | | |
| Controlling the electrical characteristics of Au n Si structure with biphenyl CoPc and OHSubsZnPc and without interfacial layer N BARAZ, İ YÜCEDAĞ, D AHMET, E GÜLÇİN, Ş ALTINDAL | | |
| Determining electrical and dielectric properties dependence on various frequencies of Al ZnS PVA p Si MPS structures N BARAZ, İ YÜCEDAĞ, Y AzizianKalandaragh, Ş ALTINDAL | | |
| A comparative study on the main electrical parameters of Au n Si MS Au biphenyl CuPc n Si and Au biphenylSubs CoPc n Si MPS type Schottky barrier diodes SBDs A DEMİR, İ YÜCEDAĞ, E GÜLÇİN, Ş ALTINDAL, N BARAZ, M KANDAZ | | |
Prof. Dr. İbrahim YÜCEDAĞDüzce Üniversitesi, Mühendislik Fak. Bilgisayar Müh.Verified email at duzce.edu.tr
