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Giovanna Mura
Giovanna Mura
Verified email at diee.unica.it
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A review on the physical mechanisms that limit the reliability of GaN-based LEDs
M Meneghini, A Tazzoli, G Mura, G Meneghesso, E Zanoni
IEEE Transactions on Electron Devices 57 (1), 108-118, 2009
3332009
Accelerated life test of high brightness light emitting diodes
L Trevisanello, M Meneghini, G Mura, M Vanzi, M Pavesi, G Meneghesso, ...
IEEE Transactions on Device and Materials Reliability 8 (2), 304-311, 2008
2112008
Failure analysis-assisted FMEA
G Cassanelli, G Mura, F Fantini, M Vanzi, B Plano
Microelectronics Reliability 46 (9-11), 1795-1799, 2006
1292006
High temperature electro-optical degradation of InGaN/GaN HBLEDs
M Meneghini, L Trevisanello, C Sanna, G Mura, M Vanzi, G Meneghesso, ...
Microelectronics Reliability 47 (9-11), 1625-1629, 2007
1102007
Are soft breakdown and hard breakdown of ultrathin gate oxides actually different failure mechanisms?
J Su, G Mura, E Miranda
IEEE Electron Device Letters 21 (4), 167-169, 2000
972000
Failure modes and mechanisms of DC‐aged GaN LEDs
G Meneghesso, S Levada, E Zanoni, S Podda, G Mura, M Vanzi, ...
physica status solidi (a) 194 (2), 389-392, 2002
832002
Phosphors for LED-based light sources: Thermal properties and reliability issues
M Dal Lago, M Meneghini, N Trivellin, G Mura, M Vanzi, G Meneghesso, ...
Microelectronics Reliability 52 (9-10), 2164-2167, 2012
802012
Reliability of visible GaN LEDs in plastic package
G Meneghesso, S Levada, E Zanoni, G Scamarcio, G Mura, E Zanoni, ...
Microelectronics Reliability 43, 1737-1742, 2003
742003
Chip and package-related degradation of high power white LEDs
M Meneghini, M Dal Lago, N Trivellin, G Mura, M Vanzi, G Meneghesso, ...
Microelectronics Reliability 52 (5), 804-812, 2012
622012
Thermal stability analysis of high brightness LED during high temperature and electrical aging
LR Trevisanello, M Meneghini, G Mura, C Sanna, S Buso, G Spiazzi, ...
Seventh International Conference on Solid State Lighting 6669, 231-240, 2007
622007
CdTe solar cells: technology, operation and reliability
M Barbato, E Artegiani, M Bertoncello, M Meneghini, N Trivellin, ...
Journal of Physics D: Applied Physics 54 (33), 333002, 2021
442021
Influence of shunt resistance on the performance of an illuminated string of solar cells: theory, simulation, and experimental analysis
M Barbato, M Meneghini, A Cester, G Mura, E Zanoni, G Meneghesso
IEEE Transactions on Device and Materials Reliability 14 (4), 942-950, 2014
382014
Reliability predictions in electronic industrial applications
G Cassanelli, G Mura, F Cesaretti, M Vanzi, F Fantini
Microelectronics Reliability 45 (9-11), 1321-1326, 2005
322005
Sulfur-contamination of high power white LED
G Mura, G Cassanelli, F Fantini, M Vanzi
Microelectronics Reliability 48 (8-9), 1208-1211, 2008
312008
Degradation of InGaN/GaN laser diodes investigated by micro-cathodoluminescence and micro-photoluminescence
M Meneghini, S Carraro, G Meneghesso, N Trivellin, G Mura, F Rossi, ...
Applied Physics Letters 103 (23), 2013
262013
Formation of metastable solid solutions by mechanical alloying of immiscible Ag and Bi
E Musu, G Mura, G Ligios, F Delogu
Journal of alloys and compounds 576, 80-85, 2013
212013
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis
G Mura, M Vanzi
Microelectronics Reliability 50 (4), 471-478, 2010
202010
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology
L Sponton, L Cerati, G Croce, G Mura, S Podda, M Vanzi, G Meneghesso
microelectronics reliability 42, 1303-1306, 2002
172002
High brightness InGaN LEDs degradation at high injection current bias
S Levada, M Meneghini, E Zanoni, S Buso, G Spiazzi, G Meneghesso, ...
2006 IEEE International Reliability Physics Symposium Proceedings, 615-616, 2006
152006
Degradation mechanisms and lifetime of state‐of‐the‐art green laser diodes
M Marioli, M Meneghini, F Rossi, G Salviati, C de Santi, G Mura, ...
physica status solidi (a) 212 (5), 974-979, 2015
132015
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