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gillen g or gillen j or gillen jg or gillen greg or gillen j greg or gillen john g
gillen g or gillen j or gillen jg or gillen greg or gillen j greg or gillen john g
National Institute of Standards and Technology or NIST or Arizona State University
Verified email at nist.gov
Title
Cited by
Cited by
Year
UV photopatterning of alkanethiolate monolayers self-assembled on gold and silver
MJ Tarlov, DRF Burgess Jr, G Gillen
Journal of the American Chemical Society 115 (12), 5305-5306, 1993
5091993
Bandlike transport in strongly coupled and doped quantum dot solids: a route to high-performance thin-film electronics
JH Choi, AT Fafarman, SJ Oh, DK Ko, DK Kim, BT Diroll, S Muramoto, ...
Nano letters 12 (5), 2631-2638, 2012
4352012
Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry
G Gillen, S Roberson
Rapid communications in mass spectrometry 12 (19), 1303-1312, 1998
2991998
The evolution of polystyrene as a cell culture material
MJ Lerman, J Lembong, S Muramoto, G Gillen, JP Fisher
Tissue Engineering Part B: Reviews 24 (5), 359-372, 2018
2352018
Depth profiling of 4-acetamindophenol-doped poly (lactic acid) films using cluster secondary ion mass spectrometry
CM Mahoney, SV Roberson, G Gillen
Analytical Chemistry 76 (11), 3199-3207, 2004
1632004
Optimized thermal desorption for improved sensitivity in trace explosives detection by ion mobility spectrometry
M Najarro, MED Morris, ME Staymates, R Fletcher, G Gillen
Analyst 137 (11), 2614-2622, 2012
1052012
Molecular imaging secondary ion mass spectrometry for the characterization of patterned self-assembled monolayers on silver and gold
G Gillen, J Bennett, MJ Tarlov, DRF Burgess
Analytical Chemistry 66 (13), 2170-2174, 1994
1031994
3D molecular imaging SIMS
G Gillen, A Fahey, M Wagner, C Mahoney
Applied surface science 252 (19), 6537-6541, 2006
1012006
Surface analysis studies of yield enhancements in secondary ion mass spectrometry by polyatomic projectiles
ER Fuoco, G Gillen, MBJ Wijesundara, WE Wallace, L Hanley
The Journal of Physical Chemistry B 105 (18), 3950-3956, 2001
982001
High temperature materials for thin-film thermocouples on silicon wafers
KG Kreider, G Gillen
Thin Solid Films 376 (1-2), 32-37, 2000
962000
Characterization of gunpowder samples using time-of-flight secondary ion mass spectrometry (TOF-SIMS)
CM Mahoney, G Gillen, AJ Fahey
Forensic science international 158 (1), 39-51, 2006
932006
Patterning of self‐assembled alkanethiol monolayers on silver by microfocus ion and electron beam bombardment
G Gillen, S Wight, J Bennett, MJ Tarlov
Applied physics letters 65 (5), 534-536, 1994
891994
Depth profiling using C60+ SIMS—Deposition and topography development during bombardment of silicon
G Gillen, J Batteas, CA Michaels, P Chi, J Small, E Windsor, A Fahey, ...
Applied surface science 252 (19), 6521-6525, 2006
872006
Molecular ion imaging and dynamic secondary-ion mass spectrometry of organic compounds
G Gillen, DS Simons, P Williams
Analytical chemistry 62 (19), 2122-2130, 1990
851990
Biomimetic sniffing improves the detection performance of a 3D printed nose of a dog and a commercial trace vapor detector
ME Staymates, WA MacCrehan, JL Staymates, RR Kunz, T Mendum, ...
Scientific reports 6 (1), 36876, 2016
822016
Temperature-controlled depth profiling of poly (methyl methacrylate) using cluster secondary ion mass spectrometry. 1. Investigation of depth profile characteristics
CM Mahoney, AJ Fahey, G Gillen
Analytical Chemistry 79 (3), 828-836, 2007
802007
A method to determine collection efficiency of particles by swipe sampling
JR Verkouteren, JL Coleman, RA Fletcher, WJ Smith, GA Klouda, G Gillen
Measurement Science and Technology 19 (11), 115101, 2008
782008
Negative cesium sputter ion source for generating cluster primary ion beams for secondary ion mass spectrometry analysis
G Gillen, L King, B Freibaum, R Lareau, J Bennett, F Chmara
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 19 (2…, 2001
752001
Rapid analysis of trace drugs and metabolites using a thermal desorption DART-MS configuration
E Sisco, TP Forbes, ME Staymates, G Gillen
Analytical Methods 8 (35), 6494-6499, 2016
722016
Epitaxial growth of BaTiO< inf> 3</inf> thin films at 600 C by metalorganic chemical vapor deposition
DL Kaiser, MD Vaudin, LD Rotter, ZL Wang, JP Cline, CS Hwang, ...
Applied physics letters 66 (21), 2801-2803, 1995
721995
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