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Young Jun CHANG
Young Jun CHANG
Professor of Physics, University of Seoul
Verified email at uos.ac.kr - Homepage
Title
Cited by
Cited by
Year
Polarization relaxation induced by a depolarization field in ultrathin ferroelectric BaTiO 3 capacitors
DJ Kim, JY Jo, YS Kim, YJ Chang, JS Lee, JG Yoon, TK Song, TW Noh
Physical review letters 95 (23), 237602, 2005
4082005
Critical thickness of ultrathin ferroelectric BaTiO3 films
YS Kim, DH Kim, JD Kim, YJ Chang, TW Noh, JH Kong, K Char, YD Park, ...
Applied Physics Letters 86 (10), 102907-103100, 2005
3662005
Tunable polaronic conduction in anatase TiO2
S Moser, L Moreschini, J Jacimovic, OS Barisic, H Berger, A Magrez, ...
http://prl.aps.org/abstract/PRL/v110/i19/e196403, 2013
3012013
Electronic structure of graphene on single-crystal copper substrates
AL Walter, S Nie, A Bostwick, KS Kim, L Moreschini, YJ Chang, ...
Physical Review B 84 (19), 195443, 2011
2062011
Emergence of a Metal–Insulator Transition and High-Temperature Charge-Density Waves in VSe2 at the Monolayer Limit
G Duvjir, BK Choi, I Jang, S Ulstrup, S Kang, T Thi Ly, S Kim, YH Choi, ...
Nano letters 18 (9), 5432-5438, 2018
2052018
Giant Ambipolar Rashba Effect in the Semiconductor BiTeI
A Crepaldi, L Moreschini, G Autès, C Tournier-Colletta, S Moser, N Virk, ...
Physical Review Letters 109 (9), 096803, 2012
2042012
Fundamental thickness limit of itinerant ferromagnetic SrRuO 3 thin films
YJ Chang, CH Kim, SH Phark, YS Kim, J Yu, TW Noh
Physical review letters 103 (5), 057201, 2009
1882009
Highly p-doped epitaxial graphene obtained by fluorine intercalation
AL Walter, KJ Jeon, A Bostwick, F Speck, M Ostler, T Seyller, L Moreschini, ...
Applied Physics Letters 98 (18), 2011
1812011
Structure and correlation effects in semiconducting SrTiO 3
YJ Chang, A Bostwick, YS Kim, K Horn, E Rotenberg
Physical Review B 81 (23), 235109, 2010
1232010
Thickness-dependent structural phase transition of strained SrRuO 3 ultrathin films: The role of octahedral tilt
SH Chang, YJ Chang, SY Jang, DW Jeong, CU Jung, YJ Kim, JS Chung, ...
Physical Review B 84 (10), 104101, 2011
1182011
Localized electronic states induced by defects and possible origin of ferroelectricity in strontium titanate thin films
YS Kim, J Kim, SJ Moon, WS Choi, YJ Chang, JG Yoon, J Yu, JS Chung, ...
Applied Physics Letters 94 (20), 2009
1162009
Effective screening and the plasmaron bands in graphene
AL Walter, A Bostwick, KJ Jeon, F Speck, M Ostler, T Seyller, L Moreschini, ...
Physical Review B 84 (8), 085410, 2011
1132011
Electronic Structure of the Kitaev Material α-RuCl3 Probed by Photoemission and Inverse Photoemission Spectroscopies
S Sinn, CH Kim, BH Kim, KD Lee, CJ Won, JS Oh, M Han, YJ Chang, ...
Scientific reports 6 (1), 39544, 2016
912016
Ferroelectric properties of SrRuO3∕ BaTiO3∕ SrRuO3 ultrathin film capacitors free from passive layers
YS Kim, JY Jo, DJ Kim, YJ Chang, JH Lee, TW Noh, TK Song, JG Yoon, ...
Applied physics letters 88 (7), 2006
902006
Long-term stability study of graphene-passivated black phosphorus under air exposure
J Kim, SK Baek, KS Kim, YJ Chang, EJ Choi
Current Applied Physics 16 (2), 165-169, 2016
842016
Phase coexistence in the metal–insulator transition of a VO2 thin film
YJ Chang, CH Koo, JS Yang, YS Kim, DH Kim, JS Lee, TW Noh, HT Kim, ...
Thin Solid Films 486 (1-2), 46-49, 2005
812005
Kinetic roughening of ion-sputtered Pd (001) surface: beyond the Kuramoto-Sivashinsky model
TC Kim, CM Ghim, HJ Kim, DH Kim, DY Noh, ND Kim, JW Chung, ...
Physical review letters 92 (24), 246104, 2004
802004
Angle-resolved photoemission and quasiparticle calculation of ZnO: The need for d band shift in oxide semiconductors
LY Lim, S Lany, YJ Chang, E Rotenberg, A Zunger, MF Toney
Physical Review B 86 (23), 235113, 2012
782012
Role of oxygen vacancy in HfO2/SiO2/Si (100) interfaces
DY Cho, SJ Oh, YJ Chang, TW Noh, R Jung, JC Lee
Applied physics letters 88 (19), 193502, 2006
752006
Surface versus bulk characterizations of electronic inhomogeneity in a V O 2 thin film
YJ Chang, JS Yang, YS Kim, DH Kim, TW Noh, DW Kim, E Oh, B Kahng, ...
Physical Review B 76 (7), 075118, 2007
742007
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