Sebastian Stach
Sebastian Stach
University of Silesia in Katowice, Faculty of Science and Technology, Institute of Biomedical
Adresă de e-mail confirmată pe us.edu.pl - Pagina de pornire
Citat de
Citat de
AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates
D Dallaeva, Ș Țălu, S Stach, P ©karvada, P Tománek, L Grmela
Applied Surface Science 312, 81-86, 2014
Usefulness of 3D surface roughness parameters for nondestructive evaluation of pull-off adhesion of concrete layers
J Hoła, Ł Sadowski, J Reiner, S Stach
Construction and Building Materials 84, 111-120, 2015
Characterization of ETL 9357FLA photomultiplier tubes for cryogenic temperature applications
A Ankowski, M Antonello, P Aprili, F Arneodo, A Badertscher, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2006
Multifractal description of fracture morphology: theoretical basis
S Stach, J Cybo
Materials characterization 51 (1), 79-86, 2003
Stereometric parameters of the Cu/Fe NPs thin films
S Stach, Z Garczyk, S Talu, S Solaymani, A Ghaderi, R Moradian, ...
The Journal of Physical Chemistry C 119 (31), 17887-17898, 2015
Morphological features in aluminum nitride epilayers prepared by magnetron sputtering
S Stach, D Dallaeva, Ș Țălu, P Kaspar, P Tománek, S Giovanzana, ...
Materials Science-Poland 33 (1), 175-184, 2015
Topographic characterization of Cu–Ni NPs@ aC: H films by AFM and multifractal analysis
S Talu, S Stach, T Ghodselahi, A Ghaderi, S Solaymani, A Boochani, ...
The Journal of Physical Chemistry B 119 (17), 5662-5670, 2015
3-D surface stereometry studies of sputtered TiN thin films obtained at different substrate temperatures
S Stach, W Sapota, Ș Țălu, A Ahmadpourian, C Luna, N Ghobadi, ...
Journal of Materials Science: Materials in Electronics 28, 2113-2122, 2017
Surface morphology of titanium nitride thin films synthesized by DC reactive magnetron sputtering
Ș Țǎlu, S Stach, S Valedbagi, SM Elahi, R Bavadi
Materials Science-Poland 33 (1), 137-143, 2015
Multifractal spectra of atomic force microscope images of Cu/Fe nanoparticles based films thickness
Ș Țălu, S Stach, S Solaymani, R Moradian, A Ghaderi, MR Hantehzadeh, ...
Journal of Electroanalytical Chemistry 749, 31-41, 2015
Multifractal characterization of nanostructure surfaces of electrodeposited Ni-P coatings
Ș Țălu, S Stach, A Méndez, G Trejo, M Țălu
Journal of the Electrochemical Society 161 (1), D44, 2013
Epitaxy of silicon carbide on silicon: Micromorphological analysis of growth surface evolution
R Shikhgasan, Ț Ștefan, S Dinara, S Sebastian, R Guseyn
Superlattices and Microstructures 86, 395-402, 2015
Multifractal analysis of drop‐casted copper (II) tetrasulfophthalocyanine film surfaces on the indium tin oxide substrates
Ș Țălu, S Stach, A Mahajan, D Pathak, T Wagner, A Kumar, RK Bedi
Surface and Interface Analysis 46 (6), 393-398, 2014
Multifractal characterization of water soluble copper phthalocyanine based films surfaces
Ș Țălu, S Stach, A Mahajan, D Pathak, T Wagner, A Kumar, RK Bedi, ...
Electronic Materials Letters 10, 719-730, 2014
Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation
Ș Țălu, Z Markoviæ, S Stach, BT Markoviæ, M Țălu
Applied Surface Science 289, 97-106, 2014
Fracture surface--fractal or multifractal?
S Stach, J Cybo, J Chmiela
Materials Characterization 46 (2-3), 163-167, 2001
Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al0.08In0.08Ga0.84N thin film assessed by atomic force microscopy and fractal …
Ș Țălu, AJ Ghazai, S Stach, A Hassan, Z Hassan, M Țălu
Journal of Materials Science: Materials in Electronics 25, 466-477, 2014
Multifractal characteristics of titanium nitride thin films
Ș Țălu, S Stach, S Valedbagi, R Bavadi, SM Elahi, M Țălu
Materials Science-Poland 33 (3), 541-548, 2015
Film thickness effect on fractality of tin-doped In2O3 thin films
Ș Țălu, S Stach, D Raoufi, F Hosseinpanahi
Electronic Materials Letters 11, 749-757, 2015
Morphology and optical properties of SiO2-based composite thin films with immobilized terbium (III) complex with a biscoumarin derivative
D Elenkova, J Zaharieva, M Getsova, I Manolov, M Milanova, S Stach, ...
International Journal of Polymer Analysis and Characterization 20 (1), 42-56, 2015
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