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paolo bernardi
paolo bernardi
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Cited by
Cited by
Year
Identification and classification of single-event upsets in the configuration memory of SRAM-based FPGAs
M Ceschia, M Violante, MS Reorda, A Paccagnella, P Bernardi, ...
IEEE Transactions on Nuclear Science 50 (6), 2088-2094, 2003
1772003
Evaluating the effects of SEUs affecting the configuration memory of an SRAM-based FPGA
M Bellato, P Bernardi, D Bortolato, A Candelori, M Ceschia, ...
Proceedings Design, Automation and Test in Europe Conference and Exhibition …, 2004
1332004
A new hybrid fault detection technique for systems-on-a-chip
P Bernardi, LMV Bolzani, M Rebaudengo, MS Reorda, FL Vargas, ...
IEEE transactions on Computers 55 (2), 185-198, 2006
1002006
A reliability analysis of a deep neural network
A Bosio, P Bernardi, A Ruospo, E Sanchez
2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019
992019
Development flow for on-line core self-test of automotive microcontrollers
P Bernardi, R Cantoro, S De Luca, E Sánchez, A Sansonetti
IEEE Transactions on Computers 65 (3), 744-754, 2015
962015
On the evaluation of SEU sensitiveness in SRAM-based FPGAs
P Bernardi, MS Reorda, L Sterpone, M Violante
Proceedings. 10th IEEE International On-Line Testing Symposium, 115-120, 2004
812004
Simulation-based analysis of SEU effects in SRAM-based FPGAs
M Violante, L Sterpone, M Ceschia, D Bortolato, P Bernardi, MS Reorda, ...
IEEE Transactions on Nuclear Science 51 (6), 3354-3359, 2004
722004
System-in-package testing: problems and solutions
D Appello, P Bernardi, M Grosso, MS Reorda
IEEE Design & Test of Computers 23 (3), 203-211, 2006
592006
Exploiting programmable BIST for the diagnosis of embedded memory cores
D Appello, P Bernardi, A Fudoli, M Rebaudengo, MS Reorda, V Tancorre, ...
International Test Conference, 2003. Proceedings. ITC 2003., 379-379, 2003
532003
Exploring the mysteries of system-level test
I Polian, J Anders, S Becker, P Bernardi, K Chakrabarty, N ElHamawy, ...
2020 IEEE 29th Asian Test Symposium (ATS), 1-6, 2020
432020
Agri-food traceability management using a RFID system with privacy protection
P Bernardi, C Demartini, F Gandino, B Montrucchio, M Rebaudengo, ...
21st International Conference on Advanced Information Networking and …, 2007
432007
On-line functionally untestable fault identification in embedded processor cores
P Bernardi, M Bonazza, E Sánchez, MS Reorda, O Ballan
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2013
412013
Fault grading of software-based self-test procedures for dependable automotive applications
P Bernardi, M Grosso, E Sánchez, O Ballan
2011 Design, Automation & Test in Europe, 1-2, 2011
372011
An effective technique for the automatic generation of diagnosis-oriented programs for processor cores
P Bernardi, EES Sánchez, M Schillaci, G Squillero, MS Reorda
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008
362008
An anti-counterfeit mechanism for the application layer in low-cost RFID devices
P Bernardi, F Gandino, F Lamberti, B Montrucchio, M Rebaudengo, ...
2008 4th European Conference on Circuits and Systems for Communications, 227-231, 2008
332008
Using infrastructure IPs to support SW-based self-test of processor cores
P Bernardi, M Rebaudengo, S Reorda
Fifth International Workshop on Microprocessor Test and Verification (MTV'04 …, 2004
332004
An effective approach to automatic functional processor test generation for small-delay faults
A Riefert, L Ciganda, M Sauer, P Bernardi, MS Reorda, B Becker
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
322014
A programmable BIST for DRAM testing and diagnosis
P Bernardi, M Grosso, MS Reorda, Y Zhang
2010 IEEE International Test Conference, 1-10, 2010
322010
An effective technique for minimizing the cost of processor software-based diagnosis in SoCs
P Bernardi, E Sánchez, M Schillaci, G Squillero, MS Reorda
Proceedings of the Design Automation & Test in Europe Conference 1, 1-6, 2006
322006
On the in-field functional testing of decode units in pipelined RISC processors
P Bernardi, R Cantoro, L Ciganda, E Sánchez, MS Reorda, S De Luca, ...
2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2014
312014
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