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- Mark M. TehranipoorIntel Charles E. Young Endowed Chair Professor, ECE, University of FloridaVerified email at ufl.edu
- Domenic ForteProfessor of ECE, University of FloridaVerified email at ece.ufl.edu
- B. M. S. Bahar TalukderGPU Implementation, AppleVerified email at apple.com
- Biswajit RayColorado State UniversityVerified email at colostate.edu
- Farah FerdausArgonne National LaboratoryVerified email at anl.gov
- Kan XiaoIntel, University of ConnecticutVerified email at engr.uconn.edu
- Sadman SakibNVM Reliability R&D EngineerVerified email at intel.com
- Fahim RahmanResearch Assistant ProfessorVerified email at ece.ufl.edu
- Zimu GuoUniversity of FloridaVerified email at ufl.edu
- M. Sadik AwalPhD Candidate, SeRLoP Research Lab, Florida International UniversityVerified email at fiu.edu
- Preeti KumariProduct Quality and Reliability Engineer at Micron Inc.Verified email at alumni.uah.edu
- Mehdi AnwarProfessor of Electrical EngineeringVerified email at uconn.edu
- Anas MazadySensata TechnologiesVerified email at sensata.com
- Fathi AmsaadWright State UniversityVerified email at wright.edu
- Aleksandar MilenkovicThe University of Alabama in HuntsvilleVerified email at uah.edu
- Md Imtiaz RashidUniversity of Texas at DallasVerified email at utdallas.edu
- Mehdi SadiAuburn University,Auburn,ALVerified email at auburn.edu
- Nima KarimianWest Virginia UniversityVerified email at mix.wvu.edu
- Sara TehranipoorWest Virginia UniversityVerified email at mail.wvu.edu
- Thomas (Tommy) H. MorrisUniversity of Alabama in HuntsvilleVerified email at uah.edu