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Co-authors
- Chi Wan SungDepartment of Electrical Engineering, City University of Hong KongVerified email at cityu.edu.hk
- Kenneth ShumThe Chinese University of Hong Kong (Shenzhen)Verified email at cuhk.edu.cn
- Chung Shue (Calvin) ChenNokia Bell Labs, DMTS, SMIEEEVerified email at nokia-bell-labs.com
- Robert JT MorrisNational University of SingaporeVerified email at nus.edu.sg
- John BaillieulProfessor of Engineering, Boston UniversityVerified email at bu.edu
- Mooi Choo ChuahProfessor of CSE Dept, Lehigh UniversityVerified email at cse.lehigh.edu
- Ye-Qiong Song + YeQiong SongUniversité de LorraineVerified email at loria.fr
- Fengjun LiUniversity of KansasVerified email at ku.edu
- Shenghao YangThe Chinese University of Hong Kong, ShenzhenVerified email at cuhk.edu.cn
- Yupeng ZhangUniversity of Illinois Urbana ChampaignVerified email at illinois.edu
- Danny Z ChenProfessor of Computer Science & Engineering, University of Notre DameVerified email at nd.edu
- Peter X. LiuCarleton UniversityVerified email at sce.carleton.ca
- Azer BestavrosProfessor of Computer Science, Boston UniversityVerified email at bu.edu