Multisensor data fusion in dimensional metrology A Weckenmann, X Jiang, KD Sommer, U Neuschaefer-Rube, J Seewig, ... CIRP annals 58 (2), 701-721, 2009 | 386 | 2009 |
Automated scenario generation for regression testing of autonomous vehicles E Rocklage, H Kraft, A Karatas, J Seewig 2017 ieee 20th international conference on intelligent transportation …, 2017 | 113 | 2017 |
Linear and robust Gaussian regression filters J Seewig Journal of Physics: conference series 13 (1), 254, 2005 | 110 | 2005 |
Unambiguous evaluation of a chirp measurement standard J Seewig, M Eifler, G Wiora Surface Topography: Metrology and Properties 2 (4), 045003, 2014 | 49 | 2014 |
Calibration sample for arbitrary metrological characteristics of optical topography measuring instruments M Eifler, J Hering, G Von Freymann, J Seewig Optics express 26 (13), 16609-16623, 2018 | 43 | 2018 |
Ti surface modification by cold spraying with TiO2 microparticles K Schmidt, S Buhl, N Davoudi, C Godard, R Merz, I Raid, E Kerscher, ... Surface and coatings technology 309, 749-758, 2017 | 43 | 2017 |
Grinding energy modeling based on friction, plowing, and shearing BS Linke, I Garretson, F Torner, J Seewig Journal of Manufacturing Science and Engineering 139 (12), 121009, 2017 | 42 | 2017 |
Optisches Messen technischer Oberflächen: Messprinzipien und Begriffe M Rahlves Beuth Verlag, 2009 | 39 | 2009 |
Manufacturing of new roughness standards for the linearity of the vertical axis–Feasibility study and optimization M Eifler, F Schneider, J Seewig, B Kirsch, JC Aurich Engineering Science and Technology, an International Journal 19 (4), 1993-2001, 2016 | 32 | 2016 |
Praxisgerechte signalverarbeitung zur trennung der gestaltabweichungen technischer oberflächen J Seewig Shaker, 2000 | 28 | 2000 |
Extraction of shape and roughness using scattering light J Seewig, G Beichert, R Brodmann, H Bodschwinna, M Wendel Optical Measurement Systems for Industrial Inspection VI 7389, 223-233, 2009 | 27 | 2009 |
Application of function-oriented roughness parameters using confocal microscopy K Klauer, M Eifler, J Seewig, B Kirsch, JC Aurich Engineering Science and Technology, an International Journal 21 (3), 302-313, 2018 | 26 | 2018 |
Manufacturing of the ISO 25178-70 material measures with direct laser writing: a feasibility study M Eifler, J Hering, G von Freymann, J Seewig Surface Topography: Metrology and Properties 6 (2), 024010, 2018 | 26 | 2018 |
Design and verification of geometric roughness standards by reverse engineering J Seewig, M Eifler, F Schneider, JC Aurich Procedia CIRP 45, 259-262, 2016 | 25 | 2016 |
Crossing-the-line segmentation as a basis for Rsm and Rc Evaluation J Seewig, PJ Scott, M Eifler, B Barwick, D Hüser Surface Topography: Metrology and Properties 8 (2), 024010, 2020 | 24 | 2020 |
Correlation between different cutting conditions, surface roughness and dimensional accuracy when ball end micro milling material measures with freeform surfaces K Klauer, M Eifler, B Kirsch, J Seewig, JC Aurich Machining Science and Technology 24 (3), 446-464, 2020 | 23 | 2020 |
Areal filtering methods J Seewig Characterisation of Areal Surface Texture, 71-114, 2024 | 22 | 2024 |
Influence of surface morphology on fatigue behavior of metastable austenitic stainless steel AISI 347 at ambient temperature and 300 C M Smaga, R Skorupski, P Mayer, B Kirsch, JC Aurich, I Raid, J Seewig, ... Procedia Structural Integrity 5, 989-996, 2017 | 22 | 2017 |
Application of ordinary kriging for interpolation of micro-structured technical surfaces I Raid, T Kusnezowa, J Seewig Measurement Science and Technology 24 (9), 095201, 2013 | 22 | 2013 |
Influence of kinematics and abrasive configuration on the grinding process of glass FJP Sousa, DS Hosse, I Reichenbach, JC Aurich, J Seewig Journal of materials processing Technology 213 (5), 728-739, 2013 | 21 | 2013 |