Jeffrey A Ivie
Cited by
Cited by
Water Oxidation by Mononuclear Ruthenium Complexes with TPA-Based Ligands
B Radaram, JA Ivie, WM Singh, RM Grudzien, JH Reibenspies, ...
Inorganic Chemistry 50 (21), 10564-10571, 2011
Uncovering hierarchical data structure in single molecule transport
BH Wu, JA Ivie, TK Johnson, OLA Monti
The Journal of Chemical Physics 146 (9), 092321, 2017
Unsupervised segmentation-based machine learning as an advanced analysis tool for single molecule break junction data
ND Bamberger, JA Ivie, KN Parida, DV McGrath, OLA Monti
The Journal of Physical Chemistry C 124 (33), 18302-18315, 2020
Correlated Energy-Level Alignment Effects Determine Substituent-Tuned Single-Molecule Conductance
JA Ivie, ND Bamberger, KN Parida, S Shepard, D Dyer, A Saraiva-Souza, ...
ACS Applied Materials & Interfaces 13 (3), 4267-4277, 2021
Impact of Incorporation Kinetics on Device Fabrication with Atomic Precision
JA Ivie, Q Campbell, JC Koepke, MI Brickson, PA Schultz, RP Muller, ...
Physical Review Applied 16 (5), 054037, 2021
A Model for Atomic Precision p-Type Doping with Diborane on Si (100)-2× 1
Q Campbell, JA Ivie, E Bussmann, SW Schmucker, AD Baczewski, ...
The Journal of Physical Chemistry C 125 (1), 481-488, 2021
Photothermal alternative to device fabrication using atomic precision advanced manufacturing techniques
AM Katzenmeyer, S Dmitrovic, AD Baczewski, E Bussmann, TM Lu, ...
Novel Patterning Technologies for Semiconductors, MEMS/NEMS and MOEMS 2020 …, 2020
Fast sensitive amplifier for two-probe conductance measurements in single molecule break junctions
TK Johnson, JA Ivie, J Jaruvang, OLA Monti
Review of Scientific Instruments 88 (3), 033904, 2017
Al-alkyls as acceptor dopant precursors for atomic-scale devices
JHG Owen, Q Campbell, R Santini, JA Ivie, AD Baczewski, ...
Journal of Physics: Condensed Matter 33 (46), 464001, 2021
Quantum Transport in Si: P δ-Layer Wires
JP Mendez, D Mamaluy, X Gao, EM Anderson, DAM Campbell, JA Ivie, ...
2020 International Conference on Simulation of Semiconductor Processes and …, 2020
Path Towards a Vertical TFET Enabled by Atomic Precision Advanced Manufacturing
TM Lu, X Gao, EM Anderson, JP Mendez, DAM Campbell, JA Ivie, ...
2021 Silicon Nanoelectronics Workshop (SNW), 1-2, 2021
Modeling assisted room temperature operation of atomic precision advanced manufacturing devices
X Gao, LA Tracy, EM Anderson, DAM Campbell, JA Ivie, TM Lu, ...
2020 International Conference on Simulation of Semiconductor Processes and …, 2020
Accelerated Lifetime Testing and Analysis of Delta-doped Silicon Test Structures
C Halsey, J Depoy, DAM Campbell, DR Ward, EM Anderson, ...
IEEE Transactions on Device and Materials Reliability 22 (2), 169-174, 2022
Modeling and Assessment of Atomic Precision Advanced Manufacturing (APAM) Enabled Vertical Tunneling Field Effect Transistor
X Gao, JP Mendez, TM Lu, EM Anderson, DAM Campbell, JA Ivie, ...
2021 International Conference on Simulation of Semiconductor Processes and …, 2021
Accessing Atomic-scale Phosphorus Dopant Distribution in Precise Silicon Devices by Advanced STEM Imaging and Spectroscopy
P Lu, E Anderson, S Schmucker, F Pena, E Frederick, J Ivie, E Bussmann, ...
Microscopy and Microanalysis 26 (S2), 1516-1517, 2020
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