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Co-authors
- Chung Shue (Calvin) ChenNokia Bell Labs, DMTS, SMIEEEVerified email at nokia-bell-labs.com
- Lou SalaünResearch Scientist at Nokia Bell LabsVerified email at nokia-bell-labs.com
- Hong YangBell Labs, NokiaVerified email at research.bell-labs.com
- Chi Wan SungDepartment of Electrical Engineering, City University of Hong KongVerified email at cityu.edu.hk
- jean-marie gorceProfesseur Insa LyonVerified email at inria.fr
- Dr. Giridhar KProfessor of Electrical Engineering, Indian Institute of Technology MadrasVerified email at ee.iitm.ac.in
- Amritanshu PandeyDepartment of Electronics Engineering, Indian Institute of Technology (BHU) VaranasiVerified email at iitbhu.ac.in
- Luca RoseSenior Research Engineer (MTS), Nokia Bell-LabsVerified email at nokia-bell-labs.com
- Muhammad Karam ShehzadSenior Research Specialist, Nokia Bell LabsVerified email at nokia.com